Collect. Czech. Chem. Commun. 2001, 66, 1140-1148
https://doi.org/10.1135/cccc20011140

Effects of Oil Viscosity and Interfacial Reaction on the Displacement of Oil from Porous Media

Vladimir Hornof*, Graham H. Neale and Alex Yu

Department of Chemical Engineering, University of Ottawa, K1N 6N5 Ottawa, Ontario, Canada

References

1. Atkinson H.: U.S. 1 651 311 (1927); Chem. Abstr. 1928, 22, 682.
2. Donaldson E. C., Chilingarian G. V., Yen T. F.: Enhanced Oil Recovery, II, Processes and Operations. Elsevier, Amsterdam 1989.
3. Chiwetelu C. I., Neale G. H., Hornof V., George A. E.: J. Can. Petrol. Technol. 1994, 33, 7.
4. Khulbe K. C., Hornof V., Neale G. H.: AOSTRA J. Res. 1985, 2, 95.
5. Nasr-El-Din H., Khulbe K. C., Hornof V., Neale G. H.: Rev. Inst. Fr. Petrol. 1990, 45, 231. <https://doi.org/10.2516/ogst:1990017>
6. Chiwetelu C. I., Hornof V., Neale G. H.: Chem. Eng. Sci. 1990, 45, 627.
7. Hornof V., Neale G. H., Yu A.: J. Petrol. Sci. Eng. 1994, 10, 291. <https://doi.org/10.1016/0920-4105(94)90020-5>
8. Hornof V., Bernard C.: Exp. Fluids 1992, 12, 425. <https://doi.org/10.1007/BF00193891>
9. Dormani N. A., Hornof V., Neale G. H.: J. Petrol. Sci. Eng. 1990, 4, 189. <https://doi.org/10.1016/0920-4105(90)90008-Q>
10. Polikar M., Puttagunta V. R., Ferracuti F., Farouk Ali S. M.: J. Petrol. Sci. Tech. 1988, 1, 263.
11. Touhami Y., Hornof V., Neale G. H.: J. Colloid Interface Sci. 1994, 166, 506. <https://doi.org/10.1006/jcis.1994.1325>
12. Hornof V., Morrow N.: SPE Reservoir Eng. 1988, 3, 251.
13. Morrow N. R., Lim H. T., Ward J. S.: SPE Formation Eval. 1986, 1, 89.
14. Zhou X., Torsaeter O., Xina X., Morrow N. R.: Presented at the 68th Annu. Tech. Conf. Exhibition of the SPE, SPE 26674, Houston (TX), October 3–6, 1993..
15. Shuler P. J., Kuehne D. L., Lerner R. M.: J. Petrol. Technol. 1989, 41, 80.
16. Foster W. R.: J. Petrol. Technol. 1973, 25, 205.
17. Hornof V., Neale G. H., Gholam-Hosseini M.: J. Colloid Interface Sci. 2000, 211, 196. <https://doi.org/10.1006/jcis.2000.7132>
18. Jahoda M., Hornof V.: Powder Technol. 2000, 110, 253. <https://doi.org/10.1016/S0032-5910(99)00279-X>